We present a detailed study about the epitaxial growth of Various modem mat
erials systems with large lattice misfit to GaAs substrates. The epitaxial
alignment during the initial stage of growth and the misfit accommodation p
rocess are determined by the particular interface structures which we have
investigated by high-resolution transmission electron microscopy. The resul
ts are explained with an extended coincidence lattice model and its general
applicability to heteroepitaxial growth of large-misfit systems is discuss
ed.