Impact of light illumination and passivation layer on silicon finite-ground coplanar-waveguide transmission-line properties

Citation
Sj. Spiegel et A. Madjar, Impact of light illumination and passivation layer on silicon finite-ground coplanar-waveguide transmission-line properties, IEEE MICR T, 48(10), 2000, pp. 1673-1679
Citations number
27
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
ISSN journal
00189480 → ACNP
Volume
48
Issue
10
Year of publication
2000
Pages
1673 - 1679
Database
ISI
SICI code
0018-9480(200010)48:10<1673:IOLIAP>2.0.ZU;2-9
Abstract
Modeling of silicon finite-gronnd coplanar-waveguide (FGCPW) transmission l ines is presented in this paper. It is shown that the effective substrate c onductivity increases in the presence of illumination and in the presence o f a passivation layer in the slot regions independently. As a result, the l osses of trenched FGCPW are lower than conventional FGCPW transmission line s. The strong dependence of the substrate conductivity on illumination sugg ests that optically controlled attenuators can be implemented with FGCPW tr ansmission lines exhibiting practically no phase change between the differe nt attenuation states. A new contrast ratio for optically controlled transm ission lines is derived.