Band structure information and resonant inelastic soft X-ray scattering inbroad band solids

Authors
Eisebitt, S Eberhardt, W
Citation
S. Eisebitt et W. Eberhardt, Band structure information and resonant inelastic soft X-ray scattering inbroad band solids, J ELEC SPEC, 110(1-3), 2000, pp. 335-358
Citations number
51
Categorie Soggetti
Spectroscopy /Instrumentation/Analytical Sciences
Journal title
JOURNAL OF ELECTRON SPECTROSCOPY AND RELATED PHENOMENA
ISSN journal
03682048 → ACNP
Volume
110
Issue
1-3
Year of publication
2000
Pages
335 - 358
Database
ISI
SICI code
0368-2048(200010)110:1-3<335:BSIARI>2.0.ZU;2-C
Abstract
We review the current status of resonant inelastic soft X-ray scattering in broad band solids. In particular, the opportunities and limitations of thi s technique in order to obtain band structure information are discussed and compared to the well established technique of angle resolved photoemission . (C) 2000 Elsevier Science B.V. All rights reserved.