Cu-O films have been deposited by rf sputtering using a mixture of Ar,
He and O-2 as a sputtering gas. When He was mixed with the sputtering
gas, highly oxidized Cu-O films mere obtained with low O-2 content of
the sputtering gas, compared with those deposited without He. Activat
ed particles in the plasma were investigated by optical emission spect
roscopy analysis. This enhancement of oxidation of Cu-O films is relat
ed to an increase in O-2(+) and O generated through the Penning ioniz
ation process by He-m in neutral excited metastable states.