Jc. Chun et Ws. Park, Characterization of a single-step microstrip discontinuity in a substrate using the finite-difference time-domain method, MICROW OPT, 27(4), 2000, pp. 245-248
A single-step microstrip discontinuity in a substrate is characterized usin
g the finite-difference time-domain (FDTD) method, and an equivalent circui
t model has been developed. The microstrip discontinuity newly introduced i
n this paper has a substrate thickness change in the longitudinal direction
with a uniform strip width. The discontinuity has applications in patch an
tenna Seed design and interconnections between microwave circuit modules. T
he simulation results are compared with those computed by HFSS to show good
agreement. An equivalent circuit developed from the FDTD results, which is
accurate within 2.4% in magnitudes of S-11 and S-21, can be applied for co
mputer aided designs. (C) 2000 John Wiley & Sons, Inc.