A method for measuring the diffusion coefficient of homogeneous and layered
media, based on multidistance measurements of time-resolved reflectance, i
s proposed. The diffusion coefficient is retrieved from the logarithm betwe
en two measurements of reflectance at two different distances. The proposed
procedure is simpler than others usually employed and also provides a reli
able criterion for retrieval of information on the layered structure of a d
iffusive medium. (C) 2000 Optical Society of America OCIS codes: 170.9660,
170.5280, 170.4580, 170.6980, 170.7050.