Cluster-assembled carbon films with different nanostructures: a spectroscopic study

Authors
Riedo, E Magnano, E Rubini, S Sancrotti, M Barborini, E Piseri, P Milani, P
Citation
E. Riedo et al., Cluster-assembled carbon films with different nanostructures: a spectroscopic study, SOL ST COMM, 116(5), 2000, pp. 287-292
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
116
Issue
5
Year of publication
2000
Pages
287 - 292
Database
ISI
SICI code
0038-1098(2000)116:5<287:CCFWDN>2.0.ZU;2-H
Abstract
Carbon thin films with different nanostructures grown by Cluster Beam Depos ition are studied by means of Raman Spectroscopy, X-ray photoemission spect roscopy (XPS), and electron energy loss spectroscopy (EELS). Raman and EELS of the as grown specimens show a correlation between the properties of the free carbon clusters and the properties of the films obtained by depositio n of different sized clusters. In contrast, the inhomogeneous character of the films is not reflected in the valence band states as seen by XPS. (C) 2 000 Elsevier Science Ltd. All rights reserved.