EDXRF surface shape correction for thick sample measurement using an outermark membrane

in non-destructive x-ray fluorescence analysis of ancient ceramics with var ied surface shapes, a correction of the measured x-ray fluorescence intensi ty is required, Owing to the variations in geometry, the x-ray pathlengths will differ from those obtained for the calibration of a standard sample. A method is proposed using yttrium-39 as an outer mark element on a membrane , A comparison of characteristic peak counts before and after correction is reported for pottery pieces with different shapes, The analytical error in volved in this method is discussed. Copyright (C) 2000 John Wiley & Sons, L td.