PHOTOACTIVITY ENHANCEMENT OF WS2 SPUTTERED THIN-FILMS BY USE OF NICKEL

Citation
O. Lignier et al., PHOTOACTIVITY ENHANCEMENT OF WS2 SPUTTERED THIN-FILMS BY USE OF NICKEL, Thin solid films, 299(1-2), 1997, pp. 45-52
Citations number
34
Categorie Soggetti
Physics, Applied","Material Science","Physics, Condensed Matter
Journal title
ISSN journal
00406090
Volume
299
Issue
1-2
Year of publication
1997
Pages
45 - 52
Database
ISI
SICI code
0040-6090(1997)299:1-2<45:PEOWST>2.0.ZU;2-T
Abstract
Photoactive thin films of WS2 have been prepared by radio frequency ma gnetron sputtering. Physico-chemical properties of the films are mainl y investigated by Rutherford backscattering and X-ray diffraction. Opt ical and transport properties are also studied. Films sputtered at a h igh substrate temperature are made of small bidimensional grains (2H-W S2) surrounded by amorphous boundaries. The photoactivity of these fil ms is weak because of the electron trapping at boundaries. Films sputt ered at a low substrate temperature are amorphous and then annealed to produce bidimensional films. It is shown that annealed Ni-coated film s give highly textured samples. A nickel-sulphur phase is assumed to a ct as a surfactant. The strong photoactivity enhancement of these film s is attributed to an increase in the grain size. (C) 1997 Elsevier Sc ience S.A.