F. Iwata et al., SCANNING-TUNNELING-MICROSCOPY COMBINED QUARTZ-CRYSTAL MICROBALANCE FOR STUDY OF NH3 ADSORPTION ON AG THIN-FILM, Thin solid films, 299(1-2), 1997, pp. 78-81
Scanning tunneling microscopy for the observation of the surface topog
raphy and quartz crystal microbalance for the micro mass measurement o
f the thin film have been combined to investigate the morphology chang
e of the surface of Ag thin film. Ag is evaporated on the surface of t
he AT-cut quartz crystal which is oscillated at the resonance frequenc
y. The mass change for the adsorption or the desorption results in a s
hift in the resonance frequency. Thus the mass of the adsorption or th
e desorption can be measured by detecting the frequency shift of the q
uartz crystal oscillator. In situ morphology and mass changes as littl
e as 320 ng cm(-2) in the NH3 adsorbed process on Ag surface are obser
ved by the combined system of the scanning tunneling microscopy and th
e quartz crystal microbalance. (C) 1997 Elsevier Science S.A.