Diffusion of zinc in InP, InAsP and InGaAs by the metal-organic vapor-phase diffusion technique

Citation
M. Wada et al., Diffusion of zinc in InP, InAsP and InGaAs by the metal-organic vapor-phase diffusion technique, DEFECT DIFF, 183-1, 2000, pp. 153-161
Citations number
31
Categorie Soggetti
Current Book Contents","Current Book Contents
ISSN journal
10120386
Volume
183-1
Year of publication
2000
Pages
153 - 161
Database
ISI
SICI code
1012-0386(2000)183-1:<153:DOZIII>2.0.ZU;2-T
Abstract
A new technique of zinc diffusion into InP, InAsP and InGaAs by metal-organ ic vapor-phase diffusion, whereby a low-pressure metal-organic vapor-phase epitaxy with dimethylzinc and phosphine is utilized as an open tube diffusi on system, is described. This technique allows the diffusion depth to be pr ecisely controlled in the submicrometer range, is easy to scale up, and giv es highly reproducible results. Results on the concentration dependence of the zinc diffusion coefficient, the activation of zinc accepters by anneali ng obtained from the diffusion profiles as well as the change of zinc incor poration near the surface under various diffusion conditions are presented.