A new technique of zinc diffusion into InP, InAsP and InGaAs by metal-organ
ic vapor-phase diffusion, whereby a low-pressure metal-organic vapor-phase
epitaxy with dimethylzinc and phosphine is utilized as an open tube diffusi
on system, is described. This technique allows the diffusion depth to be pr
ecisely controlled in the submicrometer range, is easy to scale up, and giv
es highly reproducible results. Results on the concentration dependence of
the zinc diffusion coefficient, the activation of zinc accepters by anneali
ng obtained from the diffusion profiles as well as the change of zinc incor
poration near the surface under various diffusion conditions are presented.