High Q microwave inductors on silicon by surface tension self-assembly

Citation
Gw. Dahlmann et Em. Yeatman, High Q microwave inductors on silicon by surface tension self-assembly, ELECTR LETT, 36(20), 2000, pp. 1707-1708
Citations number
7
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
ELECTRONICS LETTERS
ISSN journal
00135194 → ACNP
Volume
36
Issue
20
Year of publication
2000
Pages
1707 - 1708
Database
ISI
SICI code
0013-5194(20000928)36:20<1707:HQMIOS>2.0.ZU;2-8
Abstract
A new technique is presented for the fabrication of three-dimensional metal structures by surface tension-induced folding of flat structures. This ful ly parallel. low temperature method is suitable for post-processing on inte grated circuits, and in a first application is used to decouple inductors f or radio- and microwave-frequency integrated circuits from their substrates , to reduce losses and parasitic capacitance. Meandered microwave inductors have been fabricated on a low resistivity silicon substrate, and a peak Q of 10 was measured, at 1GHz, for a 2nH inductor standing vertically, compar ed to a peak Q of 4 for the same structure before self assembly.