AFM study of surface roughening in sputter-deposited nickel films on ITO glasses

Authors
Saitou, M Makabe, A Tomoyose, T
Citation
M. Saitou et al., AFM study of surface roughening in sputter-deposited nickel films on ITO glasses, EUROPH LETT, 52(2), 2000, pp. 185-188
Citations number
15
Categorie Soggetti
Physics
Journal title
EUROPHYSICS LETTERS
ISSN journal
02955075 → ACNP
Volume
52
Issue
2
Year of publication
2000
Pages
185 - 188
Database
ISI
SICI code
0295-5075(200010)52:2<185:ASOSRI>2.0.ZU;2-T
Abstract
We have studied the kinetic surface roughening of nickel films sputter-depo sited on ITO glasses within a temperature range from 423 K to 573 K. The sc aling exponents were determined by the surface measurements of AFM and comp ared with theoretical values in the surface diffusion-driven growth model.