Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure

Citation
S. Chada et al., Copper substrate dissolution in eutectic Sn-Ag solder and its effect on microstructure, J ELEC MAT, 29(10), 2000, pp. 1214-1221
Citations number
9
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
29
Issue
10
Year of publication
2000
Pages
1214 - 1221
Database
ISI
SICI code
0361-5235(200010)29:10<1214:CSDIES>2.0.ZU;2-I
Abstract
The dissolution of Cu into molten Sn-3.8at.%Ag (Sn-3.5wt.%Ag) solder and it s effect on microstructure were studied by light microscopy, scanning micro scopy, and x-ray microanalysis. X-ray microanalysis of the average Cu conte nt of samples soldered under various conditions showed that the amount of C u dissolved during soldering increased with increasing soldering temperatur e and time and that the rate of dissolution could be described by a Nernst- Brunner equation. Microstructurally it was found that the volume fractions of primary beta(Sn) dendrites and eta-phase dendrites increase with increas ing soldering temperature and time. The microstructural changes can be expl ained using Sn-Ag-Cu phase equilibrium data. A numerical method was develop ed for calculating the amount of Cu dissolved under non-isothermal conditio ns, which describes dissolution reasonably well.