Reliability of composite solder bumps produced by an in-situ process

Citation
Jh. Lee et al., Reliability of composite solder bumps produced by an in-situ process, J ELEC MAT, 29(10), 2000, pp. 1264-1269
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JOURNAL OF ELECTRONIC MATERIALS
ISSN journal
03615235 → ACNP
Volume
29
Issue
10
Year of publication
2000
Pages
1264 - 1269
Database
ISI
SICI code
0361-5235(200010)29:10<1264:ROCSBP>2.0.ZU;2-K
Abstract
In an attempt to develop a thermally stable solder system, an in-situ Pb-Sn solder composite reinforced with Gu,Sn, dispersoids was investigated for i ts thermal stability. The stability was evaluated mainly by measuring the g rowth rate of intermetallics at in-situ composite solder/BLM interface as a function of the number of reflow soldering cycles and aging time. The rate s were compared with those of the eutectic Pb-Sn and Sn-Ag solders. After t he thermal treatments, the solder joints were tested for their shear streng ths. The results indicated that the in-situ composite solder has a higher s hear strength and better thermal stability than the eutectic Pb-Sn solder.