This article addresses a bounded system of compact smooth surfaces in three
-dimensional space. Recently, an unbiased estimator of the integral mixed c
urvature of the given system based on a vertical sampling design has been p
roposed. The aims of the present paper are: (i) to show that the proposed e
stimator may have an infinite variance; (ii) to suggest a modification that
has better statistical properties; (iii) to extend the point estimator to
a function that monitors the curvature along the gradient microstructures;
(iv) to present an application of the method to real microscopic images.