The influence of surface states and light attenuation on transient phenomena in photorefractive films

Citation
V. Kalinin et L. Solymar, The influence of surface states and light attenuation on transient phenomena in photorefractive films, J OPT A-P A, 2(5), 2000, pp. 405-410
Citations number
15
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS
ISSN journal
14644258 → ACNP
Volume
2
Issue
5
Year of publication
2000
Pages
405 - 410
Database
ISI
SICI code
1464-4258(200009)2:5<405:TIOSSA>2.0.ZU;2-F
Abstract
The distribution of free electrons and the formation of the electric field from the dark condition are analysed in an insulator-photorefractive (PR) f ilm-insulator sandwich illuminated by a single optical beam in the absence of an external electric field. Boundary conditions are derived that take in to account the dynamics of fast surface states. The mathematical solution f or the transient process is obtained, based on the well known transport equ ations of photorefractive theory. The role of surface states and attenuatio n is discussed. In particular, it is shown that the character of transients in the boundary depletion layers depends on the ratio of the charged surfa ce state lifetime to the dielectric relaxation time. It is also shown that the width of the depletion layers varies with time if the diffusion length differs from the Debye length.