m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides

Citation
S. Monneret et al., m-lines technique: prism coupling measurement and discussion of accuracy for homogeneous waveguides, J OPT A-P A, 2(3), 2000, pp. 188-195
Citations number
25
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS
ISSN journal
14644258 → ACNP
Volume
2
Issue
3
Year of publication
2000
Pages
188 - 195
Database
ISI
SICI code
1464-4258(200005)2:3<188:MTPCMA>2.0.ZU;2-O
Abstract
A method is proposed to measure the thickness of the air layer between the prism and the waveguide in a totally reflecting prism coupler. The coupling efficiency of a Gaussian beam from the prism into the waveguide can be cal culated when the air-layer thickness (ALT) is known. To perform measurements of the indices and thicknesses of planar waveguides using the m-lines technique, it is necessary to have a good knowledge of t he prism's characteristics and to accurately measure the angles. However, w e show by means of an example that the small distance between the prism and the guide (i.e. the ALT) should be taken into account in order to achieve accurate measurements.