Total internal reflection holographic recording in very thin films

Authors
Sainov, S Stoycheva-Topalova, R
Citation
S. Sainov et R. Stoycheva-topalova, Total internal reflection holographic recording in very thin films, J OPT A-P A, 2(2), 2000, pp. 117-120
Citations number
14
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
JOURNAL OF OPTICS A-PURE AND APPLIED OPTICS
ISSN journal
14644258 → ACNP
Volume
2
Issue
2
Year of publication
2000
Pages
117 - 120
Database
ISI
SICI code
1464-4258(200003)2:2<117:TIRHRI>2.0.ZU;2-T
Abstract
We present a theoretical background and experimental verification of hologr aphic recording in nano-sized films. The interference pattern is created by a total internal reflected (TIR) reference wave and normally incident plan e one. Due to a surface-propagating evanescent wave, the holographic record ing is stored in 39 nm arsenic trisulfide film. The exposure and modulation dependence on the diffraction efficiency is investigated. The angular and wavelength selectivity of the thin TIR hologram is shown to be similar to t hat of thick Bragg gratings.