Sh. Tsai et al., A simple and new 45 degrees homo-biepitaxial Y1Ba2Cu3Oy junction on yttrium-stabilized zirconia substrates, PHYSICA C, 339(3), 2000, pp. 155-160
We have developed a new bi-epitaxial structure, namely YBCO (780 degrees C)
/YBCO (600 degrees C)/YSZ tin-plane rotation 45 degrees) and YBCO (780 degr
ees C)/YSZ tin-plane rotation 0 degrees) boundary. In comparison to the YBC
O/CeO2/YSZ/MgO tin-plane rotation 45 degrees) and YBCO/MgO tin-plane rotati
on 0 degrees) boundary previously developed in our laboratory, the new prep
aration is much simpler and has many advantages. For one, this method avoid
s the difficulty of lattice mismatch between the pure YBCO him and the MgO
substrate. A clean 45 degrees rotation can be achieved without growing diff
erent kinds of buffer layers. Furthermore, the first YBCO layer can be used
as an endpoint indication during dry etching for device fabrication. Most
importantly, the I-V curves taken at low temperatures show the RST behavior
, with a high Je value (similar to 10(5) A/cm(2)) and ICRN product (similar
to 1 mV) at 4.2 K. (C) 2000 Elsevier Science B.V. All rights reserved.