We performed a systematic analysis of the tunneling magnetoresistance (TMR)
effect in single grain-boundary junctions formed in epitaxial La2/3Ca1/3Mn
O3 films deposited on SrTiO3 bicrystals. For magnetic fields H applied para
llel to the gain-boundary barrier, an ideal two-level resistance switching
behavior with sharp transitions is observed with a TMR effect of up to 300%
at 4.2 K and still above 100% at 77 K. Varying the angle between H and the
grain boundary results in differently shaped resistance vs H curves. The o
bserved behavior is explained within a model of magnetic domain pinning at
the grain-boundary interface.