A study of thin films of quaterthiophene grown by organic molecular beam de
position on different substrates under highly controlled growth conditions
is presented. Polarized absorption measurements reveal a complete macroscop
ic orientation of the films deposited on potassium acid phtalate (KAP) sing
le crystals. X-ray diffraction measurements have been performed on films de
posited on different substrates and the results interpreted in relation wit
h the optical properties. Epitaxial growth is demonstrated for the films de
posited on KAP combining the results of optical and structural analysis. (C
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