Breakdown of rotational symmetry at semiconductor interfaces: A microscopic description of valence subband mixing

Citation
S. Cortez et al., Breakdown of rotational symmetry at semiconductor interfaces: A microscopic description of valence subband mixing, ACT PHY P A, 98(3), 2000, pp. 303-323
Citations number
25
Categorie Soggetti
Physics
Journal title
ACTA PHYSICA POLONICA A
ISSN journal
05874246 → ACNP
Volume
98
Issue
3
Year of publication
2000
Pages
303 - 323
Database
ISI
SICI code
0587-4246(200009)98:3<303:BORSAS>2.0.ZU;2-Z
Abstract
The recently discovered in-plane optical anisotropy of [001]-grown quantum wells offers a new theoretical and experimental insight into the electronic properties of semiconductor interfaces. We first discuss the coupling of X and Y valence bands due to the breakdown of rotation inversion symmetry at a semiconductor hetero-interface, with special attention to its dependence on effective parameters such as the valence band offset. The intracell loc alization of Bloch functions is explained from simple theoretical arguments and evaluated numerically from a pseudo-potential microscopic model. The r ole of envelope functions is then considered, and we discuss the specific c ase of non-common atom interfaces. Experimental results and applications to interface characterization are presented. These calculations give a micros copic justification, and establish the limits of the heuristic "H-BF" model .