Direct characterization of terahertz radiation from the dynamics of the semiconductor surface field

Citation
Py. Han et al., Direct characterization of terahertz radiation from the dynamics of the semiconductor surface field, APPL PHYS L, 77(18), 2000, pp. 2864-2866
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
APPLIED PHYSICS LETTERS
ISSN journal
00036951 → ACNP
Volume
77
Issue
18
Year of publication
2000
Pages
2864 - 2866
Database
ISI
SICI code
0003-6951(20001030)77:18<2864:DCOTRF>2.0.ZU;2-H
Abstract
We report on a time-resolved electro-optic sampling of the photocarrier-ind uced surface field dynamics by a midband gap probe beam from a femtosecond fiber laser. By measuring the ultrafast surface field variation, we are abl e to derive the undistorted terahertz wave form radiated from the semicondu ctor surface that is excited by the femtosecond laser pulses. The derived w ave form agrees well with the directly measured terahertz radiation at the far field. The peak frequency of terahertz radiation is found to increase w ith the carrier density, which can be explained in terms of field dynamics. (C) 2000 American Institute of Physics. [S0003-6951(00)01944-6].