Mp. Mateo et al., Fast atomic mapping of heterogeneous surfaces using microline-imaging laser-induced breakdown spectrometry, APPL SPECTR, 54(10), 2000, pp. 1429-1434
A new approach for quick simultaneous and multielemental characterization o
f heterogeneous solid samples using laser-induced breakdown spectrometry (L
IBS) is presented. The basic idea relies on focusing the incident laser bea
m with a cylindrical lens to produce a long and narrow microline plasma. Th
e emitted light is then projected along the spectrograph slit, where each a
blated location on the sample generates a signal at a defined height, and a
cquired with a charge-coupled device (CCD) detector. The method has been te
sted for compositional mapping of solar cells, enabling a 25-fold increase
of analysis speed as compared to conventional LIES configuration.