Electrical and photoelectrical properties of vacuum deposited SnSe thin films

Citation
Dp. Padiyan et al., Electrical and photoelectrical properties of vacuum deposited SnSe thin films, CRYST RES T, 35(8), 2000, pp. 949-957
Citations number
24
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
CRYSTAL RESEARCH AND TECHNOLOGY
ISSN journal
02321300 → ACNP
Volume
35
Issue
8
Year of publication
2000
Pages
949 - 957
Database
ISI
SICI code
0232-1300(2000)35:8<949:EAPPOV>2.0.ZU;2-P
Abstract
Polycrystalline thin films of tin selenide have been prepared by vacuum dep osition at a substrate temperature of 150 degreesC and reported. X-ray diff raction, optical transmission, electrical conductivity and photoconductivit y studies have been carried out on these films. Annealing the films at 300 degreesC for 2 hours improves the crystallinity and a preferred orientation along the (111) plane develops. The optical transmission measurement revea ls that the SnSe thin films have a direct allowed band gap of 1.26 eV. Elec trical conductivity study shows that the conductivity increases with increa sing temperature. The observed electrical conductivity at low temperature i s explained based on hopping conduction mechanism. The photoconductivity me asurement indicates the presence of continuously distributed deep localised gap states in this material.