Electrochemically modulated diffraction - A novel strategy for the determination of conduction-band-edge energies for nanocrystalline thin-film semiconductor electrodes
Xj. Dang et al., Electrochemically modulated diffraction - A novel strategy for the determination of conduction-band-edge energies for nanocrystalline thin-film semiconductor electrodes, EL SOLID ST, 3(12), 2000, pp. 555-558
Micropatterned titanium dioxide thin-film electrodes exhibit efficient diff
raction in the presence of aqueous or nonaqueous electrolyte solutions. The
diffraction efficiency can be modulated electrochemically. At the waveleng
ths examined, the modulation is caused by changes in both real and imaginar
y components of the refractive index. The index changes, in turn, are cause
d by the addition of electrons to near-band-edge trap sites and by optical
absorption by the trapped electrons. The onset potential for diffraction mo
dulation provides a good measure of the potential of the electrode's conduc
tion bandedge. Variable excitation wavelength measurements show that, after
correction for absorption losses, the electrochemically induced changes in
the proportion of light diffracted can be either positive or negative. The
signs and the relative magnitudes of the wavelength-dependent changes are
well described by a Kramers-Kronig analysis that assumes that changes in th
e real component of the refractive index dominate the response. (C) 2000 Th
e Electrochemical Society. S1099-0062(00)07-101-7. All rights reserved.