Analysis of Si-F bonds on Si(111) surface by electrochemical method

Citation
F. Bensliman et al., Analysis of Si-F bonds on Si(111) surface by electrochemical method, EL SOLID ST, 3(12), 2000, pp. 566-568
Citations number
23
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
ELECTROCHEMICAL AND SOLID STATE LETTERS
ISSN journal
10990062 → ACNP
Volume
3
Issue
12
Year of publication
2000
Pages
566 - 568
Database
ISI
SICI code
1099-0062(200012)3:12<566:AOSBOS>2.0.ZU;2-#
Abstract
Electrochemical current at Si(111) has been investigated in dilute HF solut ion as a function of surface pretreatment which controls the amount of Si-F bonds on the surface. When the partly F-covered surface is immersed in dil ute HF solution, anodic current transient flows as the surface Si atoms bon ded to F atoms dissolve into the solution and the surface is hydrogen termi nated. The anodic current becomes very small if the F-covered surface is tr eated with oxygen-free water, which is effective for removing Si-F from the surface and for making a completely hydrogen-terminated Si(111) surface. A ll results suggest that the anodic current can be a good measure for the ev aluation of a small amount of Si-F bonds on Si surfaces. (C) 2000 The Elect rochemical Society. S1099-0062(00)06-055-7. All rights reserved.