Thin film write head field analysis using a benchmark problem

A benchmark problem has been proposed by the Storage Research Consortium (S RC) in Japan, far evaluating the applicability of computer codes to 3-D non linear eddy current analysis of thin film magnetic recording write head. Va rious codes using the finite element method are compared in terms of the wr ite head held and the computational efficiency, The difficulty in 3-D mesh generation of thin film head is also discussed. The write head fields calcu lated by various codes using different meshes show the fairly good agreemen t. The calculated write head fields are verified by measurement using a str oboscopic electron beam tomography, It is found that the calculation time s trongly depends on unknown variables.