This paper presents a novel approach for intensity calculation of X-ray dif
fraction spots based on a two-stage radial basis function (RBF) network. Th
e first stage uses pre-determined reference profiles from a database as bas
is functions in order to locate the diffraction spots and identify any over
lapping regions. The second-stage RBF network employs narrow basis function
s capable of local modifications of the reference profiles leading to a mor
e accurate observed diffraction spot approximation and therefore accurate d
etermination of spot positions and integrated intensities.