Incorporation of Mg in metalorganic vapour phase epitaxy (MOVPE) GaN has be
en investigated, using two different Mg precursors: bis-methylcyclopentadie
nyl magnesium [(MeCp)(2)Mg] and Solution bis-cyclopentadienyl magnesium [So
lution Cp2Mg]. SIMS analysis reveals an increased (two fold) efficiency of
Mg incorporation for Solution Cp2Mg as compared to (MeCp)(2)Mg. These resul
ts are attributed to the stronger interaction of (MeCp)(2)Mg with NH3, lead
ing to the formation of alkylmagnesium amine adducts, and a reduced effecti
ve Mg surface concentration. A decreased GaN growth rate with increasing Mg
fluxes is also reported for both precursors. This effect is more pronounce
d for Solution Cp2Mg indicating that incorporation of Mg in the lattice pro
ceeds via the capture of Mg into group III sites, and that the supply of Mg
from the surface is reduced in the case when (MeCp)(2)Mg is used.