Ultrathin V films on Fe(100): growth and interfacial alloying

Authors
Igel, T Pfandzelter, R Winter, H
Citation
T. Igel et al., Ultrathin V films on Fe(100): growth and interfacial alloying, SOL ST COMM, 116(9), 2000, pp. 477-481
Citations number
19
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
SOLID STATE COMMUNICATIONS
ISSN journal
00381098 → ACNP
Volume
116
Issue
9
Year of publication
2000
Pages
477 - 481
Database
ISI
SICI code
0038-1098(2000)116:9<477:UVFOFG>2.0.ZU;2-J
Abstract
Growth and chemical composition of V films on Fe(100) are studied for tempe ratures between 370 and 620 K. Whereas the first atomic layer grows smoothl y, growth of subsequent layers is rougher and favored at high temperatures. We observe a pronounced temperature-dependent alloying, which is confined to both the interface layers. (C) 2000 Published by Elsevier Science Ltd.