Cadmium telluride thin films have been produced using the Stacked Elemental
Layer technique. The films were characterized using X-ray diffraction, opt
ical transmittance and reflectance, and atomic force microscopy. The evolut
ion of the thin film reaction and compound formation were studied using X-r
ay data. The results show that the growth is diffusion controlled and the a
ctivation energy is 81.8 kJ/mol. In addition, some physical properties of t
he films produced are reported. (C) 2000 Elsevier Science S.A. All rights r
eserved.