Fatigue and dielectric properties of the (Pb, La)TiO3 thin films with various La concentrations

Citation
Sj. Kang et al., Fatigue and dielectric properties of the (Pb, La)TiO3 thin films with various La concentrations, THIN SOL FI, 373(1-2), 2000, pp. 53-59
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Material Science & Engineering
Journal title
THIN SOLID FILMS
ISSN journal
00406090 → ACNP
Volume
373
Issue
1-2
Year of publication
2000
Pages
53 - 59
Database
ISI
SICI code
0040-6090(20000903)373:1-2<53:FADPOT>2.0.ZU;2-C
Abstract
Fatigue and dielectric properties of the PLT thin films have been studied w ith varying the La concentration. The fatigue and the dielectric properties improve remarkably with the increase of La concentration from 5 to 28 mol% . In particular, after applying 10(9) square pulses with +/-5 V, the remane nt polarization of the PLT(10) thin film decreases only approximately 20% f rom the initial state while that of the PLT(5) thin film decreases as much as 70%. As the La concentration increases from 5 to 28 mol%, the dielectric constant at 10 kHz increases from 428 to 761, while the loss tangent and t he leakage current density at 150 kV/cm decreases from 0.063 to 0.024 and 6 .96 to 0.79 muA/cm(2), respectively. These results show that PLT(10) and PL T(28) thin films are potential candidates for the capacitor dielectrics of a new generation of NVFRAM and DRAM, respectively. (C) 2000 Elsevier Scienc e S.A. All rights reserved.