Carbon nitride (CNx) and boron carbon nitride (BCxNy) films were deposited
on silicon substrates by ion beam assisted deposition (IBAD). The films wer
e deposited by evaporating graphite and boron carbide (B4C) targets to prod
uce CNx and BCN films, respectively. The assistance was performed with ions
from a precursor gas mixture of nitrogen and methane. IBAD has permitted t
o cover a wide range of compositions as a function of deposition parameters
. The film growth rate presents a voltage threshold for the CNx films and a
current threshold for the BCN films. The stoichiometry of the BCN films se
ems to be confined to two regions, depending of whether methane is included
or not in the gas feed. The film composition turns towards the more stable
arrangement, i.e. BN and B4C, as the gas mixture is enriched in nitrogen o
r methane, respectively. (C) 2000 Elsevier Science S.A. All rights reserved
.