Measurement of the modal birefringence of single-mode K+ ion-exchanged planar waveguides with polarimetric interferometry

Citation
Zm. Qi et al., Measurement of the modal birefringence of single-mode K+ ion-exchanged planar waveguides with polarimetric interferometry, APPL OPTICS, 39(31), 2000, pp. 5750-5754
Citations number
11
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science","Optics & Acoustics
Journal title
APPLIED OPTICS
ISSN journal
00036935 → ACNP
Volume
39
Issue
31
Year of publication
2000
Pages
5750 - 5754
Database
ISI
SICI code
0003-6935(20001101)39:31<5750:MOTMBO>2.0.ZU;2-4
Abstract
The polarimetric interference pattern on the surface of single-mode planar waveguides made by potassium ion exchange in soda-lime glass substrates can be observed through a 45 degrees analyzer, which allows for the high-preci sion measurement of the modal birefringence of samples in a wide range of 0 to 5 X 10(-4) Using this method, believed to be new, we investigated the e ffects of exchange temperature and time on the modal birefringence of singl e-mode potassium ion-exchanged waveguides. The modal birefringence profile was achieved by measurement of the variation of the phase difference betwee n the TE0 and the TM, modes with hydrofluoric-acid-etching depth of the sam ple. (C) 2000 Optical Society of America. OCIS codes: 190.5330, 120.3180, 2 30.7390, 160.2750, 190.4350.