Zm. Qi et al., Measurement of the modal birefringence of single-mode K+ ion-exchanged planar waveguides with polarimetric interferometry, APPL OPTICS, 39(31), 2000, pp. 5750-5754
The polarimetric interference pattern on the surface of single-mode planar
waveguides made by potassium ion exchange in soda-lime glass substrates can
be observed through a 45 degrees analyzer, which allows for the high-preci
sion measurement of the modal birefringence of samples in a wide range of 0
to 5 X 10(-4) Using this method, believed to be new, we investigated the e
ffects of exchange temperature and time on the modal birefringence of singl
e-mode potassium ion-exchanged waveguides. The modal birefringence profile
was achieved by measurement of the variation of the phase difference betwee
n the TE0 and the TM, modes with hydrofluoric-acid-etching depth of the sam
ple. (C) 2000 Optical Society of America. OCIS codes: 190.5330, 120.3180, 2
30.7390, 160.2750, 190.4350.