C. Sonnichsen et al., Spectroscopy of single metallic nanoparticles using total internal reflection microscopy, APPL PHYS L, 77(19), 2000, pp. 2949-2951
We have developed a simple, fast, and flexible technique to measure optical
scattering spectra of individual metallic nanoparticles. The particles are
placed in an evanescent field produced by total internal reflection of lig
ht from a halogen lamp in a glass prism. The light scattered by individual
particles is collected using a conventional microscope and is spectrally an
alyzed by a nitrogen-cooled charge-coupled-device array coupled to a spectr
ometer. This technique is employed to measure the effect of particle diamet
er on the dephasing time of the particle plasmon resonance in gold nanopart
icles. We also demonstrate the use of this technique for measurements in li
quids, which is important for the potential application of particle plasmon
s in chemical or biological nanosensors. (C) 2000 American Institute of Phy
sics. [S0003-6951(00)01745-9].