Instrument calibrations and data analysis procedures for the NEAR X-ray spectrometer

Citation
R. Starr et al., Instrument calibrations and data analysis procedures for the NEAR X-ray spectrometer, ICARUS, 147(2), 2000, pp. 498-519
Citations number
17
Categorie Soggetti
Space Sciences
Journal title
ICARUS
ISSN journal
00191035 → ACNP
Volume
147
Issue
2
Year of publication
2000
Pages
498 - 519
Database
ISI
SICI code
0019-1035(200010)147:2<498:ICADAP>2.0.ZU;2-0
Abstract
The X-Ray spectrometer onboard the Near Earth Asteroid Rendezvous spacecraf t will measure X-rays from the surface of 433 Eros in the energy region 0.7 -10 keV, Detection of characteristic K alpha line emissions from Mg, Al, Si , Ca, Ti, and Fe will allow the determination of surface abundances of thes e geologically important elements, Spatial resolution as fine as 3 km will be possible for those elements where counting statistics are not a limiting factor, These measurements will make it possible to relate Eros to known c lasses of meteorites and reveal geological processes that occurred on Eros. The calibration measurements and analysis procedures presented here are ne cessary for the reduction and analysis of the X-ray data to be collected du ring one year of orbital operations at Eros, (C) 2000 Academic Press.