Cr. Elsass et al., Electron transport in AlGaN/GaN heterostructures grown by plasma-assisted molecular beam epitaxy, JPN J A P 2, 39(10B), 2000, pp. L1023-L1025
High quality AlGaN/GaN heterostructures have been grown by rf plasma-assist
ed molecular beam epitaxy (MBE) on n-type GaN templates grown on sapphire b
y metalorganic chemical vapor deposition (MOCVD). By optimizing the AlGaN t
hickness and the Al content, record low temperature mobilities have been ac
hieved. Temperature and magnetic field dependent Hall effect,, and Shubniko
v-de Haas oscillations, were used to probe the two-dimensional electron gas
(2DEG) with consistent results. The unintentionally doped Al0.09Ga0.91N he
terostructures exhibit a measured 77 K Hall mobility of 24,000 cm(2)/V.s (n
(sh) = 2.5 x 10(12)), 12 K mobility of 52,000 cm(2)/V.s and similar to4 K m
obility of 60,000 cm(2)/V.s (n(sh) = 2.25 x 10(12)), all records for this m
aterial system. The magnetic field dependent Hall effect revealed carriers
from the bulk GaN freeze out and that a single carrier system is dominant b
elow 80 K.