Picosecond time-resolved X-ray diffraction from Si(111) under high-power laser irradiation

Authors
Hironaka, Y Yazaki, A Saito, F Nakamura, KG Kondo, K
Citation
Y. Hironaka et al., Picosecond time-resolved X-ray diffraction from Si(111) under high-power laser irradiation, JPN J A P 2, 39(10A), 2000, pp. L984-L986
Citations number
13
Categorie Soggetti
Apllied Physucs/Condensed Matter/Materiales Science
Journal title
JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS → ACNP
Volume
39
Issue
10A
Year of publication
2000
Pages
L984 - L986
Database
ISI
SICI code
Abstract
Picosecond time-resolved X-ray diffraction is used to observe Si(111) under 300 ps pulsed laser irradiation at a power density above the damage thresh old. The pulsed X-rays (of about 9 ps pulse width) are generated by focusin g a femtosecond laser on an Fe target. The rocking curves are obtained with a time step of 50 ps. The transient lattice compression (0.9% at maximum) driven by laser-induced dielectric breakdown is directly observed.