Resonances between the cavity mode and five excitonic transitions in an InxGa1-xAs/GaAs/AlAs/AlGaAs vertical-cavity surface-emitting laser structure using photomodulated reflectance
Sa. Choulis et al., Resonances between the cavity mode and five excitonic transitions in an InxGa1-xAs/GaAs/AlAs/AlGaAs vertical-cavity surface-emitting laser structure using photomodulated reflectance, J APPL PHYS, 88(10), 2000, pp. 5547-5553
An InxGa1-xAs/GaAs/AlAs/AlGaAs vertical-cavity surface-emitting laser struc
ture has been studied by conventional reflectance and photomodulated reflec
tance (PR) spectroscopies. Slight fluctuations in molecular beam epitaxy gr
owth conditions led to thickness variations of < similar to 12% along the w
afer radius. While this did not appreciably affect the energy of the quantu
m well (QW) transitions, it did give rise to a significant but smooth varia
tion in the cavity mode energy. PR spectroscopy was used to study the inter
action between the cavity mode and QW excitons, as the overlap between them
was varied by probing different wafer regions. The PR signal was strongly
enhanced when the cavity mode and a QW transition were in good alignment. W
e were able to investigate five distinct such resonances between the cavity
mode and the ground-state and four other, higher-order, QW transitions. A
theory has already been developed for the PR modulation of the coupled cavi
ty and exciton modes, based on energy-dependent Seraphin coefficients. A si
milar but simplified model was used to fit all the PR spectra, and the resu
lting QW transition energies then compared with those predicted by a theore
tical model which includes excitonic binding energy effects. (C) 2000 Ameri
can Institute of Physics. [S0021-8979(00)02623-2].