Theoretical investigation of the initial reaction of the NO decomposition on the Si (100) (2x1) reconstructed surface

Citation
Aa. Korkin et al., Theoretical investigation of the initial reaction of the NO decomposition on the Si (100) (2x1) reconstructed surface, J CHEM PHYS, 113(18), 2000, pp. 8237-8248
Citations number
48
Categorie Soggetti
Physical Chemistry/Chemical Physics
Journal title
JOURNAL OF CHEMICAL PHYSICS
ISSN journal
00219606 → ACNP
Volume
113
Issue
18
Year of publication
2000
Pages
8237 - 8248
Database
ISI
SICI code
0021-9606(20001108)113:18<8237:TIOTIR>2.0.ZU;2-Z
Abstract
We have investigated theoretically the initial reaction of nitric oxide (NO ) with the Si(001)(2x1) surface, followed by N and O insertion into the sil icon film during the initial growth of the oxynitride film. We use quantum chemical [ab initio and density functional theory (DFT) cluster approach] a nd solid state physics (DFT with periodic boundary conditions) computationa l methods. Our study suggests a low barrier reaction path for NO decomposit ion on the Si(100)(2x1) reconstructed silicon surface. (C) 2000 American In stitute of Physics. [S0021-9606(00)31842-6].