Ns. Xu et al., The intrinsic relation between field electron emission and structure characteristics of amorphous diamond film, J PHYS D, 33(20), 2000, pp. 2568-2572
Stable electron emission from amorphous diamond film at a low threshold fie
ld of 6-7 mV m(-1) has been observed using a transparent anode technique. T
he electron emission characteristics are discussed in terms of the structur
al properties of films. Using scanning electron microscopy and Raman spectr
a, the emitting and the non-emitting regions of the amorphous diamond film
are analysed. The emitting regions exhibit rougher microstructure in morpho
logy and a stronger Raman peak at 1360 cm(-1) than the non-emitting regions
, a signature of having more micro-sp(2) components. It is suggested that f
ield emission is prone to take place at the regions containing more sp(2) n
anoclusters or nanocrystalline graphite.