RESIDUAL SURFACE-RESISTANCE OF YBA2CU3OX THIN-FILMS - WEAKLY COUPLED GRAIN MODEL

Citation
K. Yoshida et al., RESIDUAL SURFACE-RESISTANCE OF YBA2CU3OX THIN-FILMS - WEAKLY COUPLED GRAIN MODEL, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 1253-1256
Citations number
12
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
2
Pages
1253 - 1256
Database
ISI
SICI code
1051-8223(1997)7:2<1253:RSOYT->2.0.ZU;2-G
Abstract
The residual surface resistance and the magnetic penetration depth of high-T-c superconducting YBa2Cu3Ox thin films have been measured using the coplanar waveguide resonator technique, and are discussed with th e weakly coupled grain model, where the superconducting polycrystallin e thin film is described as a network of superconducting grains couple d via Josephson junctions. The observed dependence of the residual res istance and the magnetic penetration depth on the critical current den sity and the grain size is shown to demonstrate the weakly coupled gra in model of YBa2Cu3Ox thin films.