Dt. Ryan et al., CRITICAL-CURRENT MEASUREMENTS AT ELECTRIC-FIELDS IN THE PV M(-1) REGIME, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 1455-1458
We describe a technique for characterising sample lengths of commercia
l superconducting wire in closed loop configuration. This enables the
measurement of critical current, as a function of applied magnetic fie
ld, at electric field criteria in the range 10(6) to 1 pV m(-1) by det
ecting the decay of current in the closed loop. How these measurements
relate to the more traditional 4 terminal measurements made on short
sample coils is discussed and representative data from both NbTi and N
b3Sn samples are presented and analysed.