CRITICAL-CURRENT MEASUREMENTS AT ELECTRIC-FIELDS IN THE PV M(-1) REGIME

Citation
Dt. Ryan et al., CRITICAL-CURRENT MEASUREMENTS AT ELECTRIC-FIELDS IN THE PV M(-1) REGIME, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 1455-1458
Citations number
5
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
2
Pages
1455 - 1458
Database
ISI
SICI code
1051-8223(1997)7:2<1455:CMAEIT>2.0.ZU;2-3
Abstract
We describe a technique for characterising sample lengths of commercia l superconducting wire in closed loop configuration. This enables the measurement of critical current, as a function of applied magnetic fie ld, at electric field criteria in the range 10(6) to 1 pV m(-1) by det ecting the decay of current in the closed loop. How these measurements relate to the more traditional 4 terminal measurements made on short sample coils is discussed and representative data from both NbTi and N b3Sn samples are presented and analysed.