On the intrinsic origin of 1/f noise

Authors
Citation
B. Kaulakys, On the intrinsic origin of 1/f noise, MICROEL REL, 40(11), 2000, pp. 1787-1790
Citations number
14
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
11
Year of publication
2000
Pages
1787 - 1790
Database
ISI
SICI code
0026-2714(200011)40:11<1787:OTIOO1>2.0.ZU;2-S
Abstract
The problem of the intrinsic origin of 1/f noise is considered. Currents an d signals consisting of a sequence of pulses are analyzed. It is shown that the intrinsic origin of 1/f noise is a random walk of the average time bet ween subsequent pulses of the pulse sequence, or the interevent time. This results in the long-memory process for the pulse occurrence time and in 1/f type power spectrum of the signal. (C) 2000 Elsevier Science Ltd. All righ ts reserved.