Noise in nanotechnology

Authors
Kish, LB Granqvist, CG
Citation
Lb. Kish et Cg. Granqvist, Noise in nanotechnology, MICROEL REL, 40(11), 2000, pp. 1833-1837
Citations number
12
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
11
Year of publication
2000
Pages
1833 - 1837
Database
ISI
SICI code
0026-2714(200011)40:11<1833:NIN>2.0.ZU;2-Q
Abstract
The length scales dominating physical phenomena in nanotechnology are at th e boundary of the macroscopic and microscopic world. Nanoobject formation i s governed by a competition between deterministic and random forces. Theref ore, classical physical noise phenomena play an important role in determini ng structural formations and noise measurements can be used as important to ols of nanotechnology. (C) 2000 Elsevier Science Ltd. All rights reserved.