1/f phase noise in a transistor and its application to reduce the frequency fluctuation in an oscillator

Citation
K. Takagi et al., 1/f phase noise in a transistor and its application to reduce the frequency fluctuation in an oscillator, MICROEL REL, 40(11), 2000, pp. 1943-1950
Citations number
10
Categorie Soggetti
Eletrical & Eletronics Engineeing
Journal title
MICROELECTRONICS RELIABILITY
ISSN journal
00262714 → ACNP
Volume
40
Issue
11
Year of publication
2000
Pages
1943 - 1950
Database
ISI
SICI code
0026-2714(200011)40:11<1943:1PNIAT>2.0.ZU;2-K
Abstract
The 1/f noise generating mechanism is discussed with the diffusion coeffici ent fluctuation in the base. Results of noise measurements of the phase and amplitude or average current noises and their correlation coefficient in c ollector current are presented. A possible noise reduction method is sugges ted, using the correlation between the phase and amplitude fluctuations sim ultaneously. Also, measurement of the frequency and average current fluctua tions along with their correlation coefficient for transistor oscillators i s presented. In this case, it is found that both fluctuations correlate wit h each other at low frequency. A frequency stabilization technique is discu ssed and a new method to reduce the frequency fluctuation is proposed for a n oscillator using the correlation. Published by Elsevier Science Ltd.