Simulation of electromigration noise in polycrystalline metal stripes

We have performed the Monte Carlo simulation of electromigration noise in p olycrystalline metal stripes, based on a two-dimensional model which takes into account both the role of grain boundaries and the effect of current de nsity redistribution in the stripe. The noise spectrum has the characterist ic 1/f(gamma) (gamma approximate to 2) behavior, and the total noise power strongly increases with increasing damage of the stripe. The results of the simulation exhibit a substantial qualitative agreement with experiments, g iving confidence in the capability of our model of including the relevant p hysics involved in the failure process. (C) 2000 Elsevier Science Ltd. All rights reserved.