CHARACTERIZATION OF INTERFACIAL GROWTH BETWEEN BI(2212) AND AG COATING

Authors
BREITWISCH MJ KOUZOUDIS D OSTENSON JE FINNEMORE DK BALACHANDRAN U
Citation
Mj. Breitwisch et al., CHARACTERIZATION OF INTERFACIAL GROWTH BETWEEN BI(2212) AND AG COATING, IEEE transactions on applied superconductivity, 7(2), 1997, pp. 1691-1694
Citations number
4
Categorie Soggetti
Engineering, Eletrical & Electronic","Physics, Applied
Journal title
IEEE transactions on applied superconductivity → ACNP
ISSN journal
10518223
Volume
7
Issue
2
Year of publication
1997
Part
2
Pages
1691 - 1694
Database
ISI
SICI code
1051-8223(1997)7:2<1691:COIGBB>2.0.ZU;2-Y
Abstract
The growth of hillocks at the interface between Bi(2212) and Ag has be en found to occur over a wide range of oxygen partial pressure and in the vicinity of 700 degrees C, a temperature far below the Bi(2212)-Bi (2223) conversion temperature. These hillocks have been examined by en vironmental scanning microscope (ESEM) and regular SEM in secondary an d backscattering modes. Definitive chemical analysis is still an open question. The Ag is highly mobile at these temperatures.